[직수입양서]
Study of Bulk and Elementary Screw Dislocation Assisted Reverse Breakdown in Low-Voltage (Less Than 250 V) 4h-Sic P(+)N Junction Diodes. Part 1; DC Pr
[ Paperback ]
Nasa, National Aeronautics and Space Adm
Independently Published
18%
26,270원
포인트적립1,320원
Paperback