[직수입양서]
Vlsi-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2
[ Paperback ]
Shin, Youngsoo (EDT) / Tsui, Chi Ying (EDT) / Kim, Jae-joon (EDT) / Choi, Kiyoung (EDT)
Springer-Nature New York Inc
10%
166,770원
포인트적립8,340원
Paperback