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Introduction. Substrate-Induced Strain Engineering in CMOS Technology. Process-Induced Stress Engineering in CMOS Technology. Electronic Properties of Strain-Engineered Semiconductors. Strain-Engineered MOSFETs. Noise in Strain-Engineered Devices. Technology CAD of Strain-Engineered MOSFETs. Reliability and Degradation of Strain-Engineered MOSFETs. Process Compact Modelling of Strain-Engineered MOSFETs. Process-Aware Design of Strain-Engineered MOSFETs. Conclusions. Index. |